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Aehr Test Systems
Aehr Test Systems is a California-based company founded in 1977.
Overview
Structured Data
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All edits
Edits on 27 Jul, 2023
"NL fact extraction"
Golden Au
edited on 27 Jul, 2023
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B2X
B2B
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Edits on 6 May, 2023
"Covert AngelList URL to Wellfound ID"
Golden AI
edited on 6 May, 2023
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Wellfound ID
aehr-test-systems
Edits on 23 Nov, 2022
"Infobox creation from: 400 Kato Terrace Fremont, CA. 94539, USA"
Golden AI
edited on 23 Nov, 2022
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Location
Fremont, California
N Ni
edited on 23 Nov, 2022
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Full Address
400 Kato Terrace Fremont, CA. 94539, USA
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LinkedIn URL
https://www.linkedin.com/company/aehr-test-systems/
Pitchbook URL
https://pitchbook.com/profiles/company/41182-75
Edits on 13 Nov, 2022
"update citations for inverse infoboxes"
Golden AI
edited on 13 Nov, 2022
Infobox
Investors
Summit Partners
0
"update inverses"
Golden AI
edited on 13 Nov, 2022
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Investors
Summit Partners
Edits on 13 Aug, 2022
"Edit from table cell"
Екатерина Петровская
edited on 13 Aug, 2022
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+1
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Company Operating Status
Active
Oleh Korchynskyy
edited on 12 Aug, 2022
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+1
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Location
United States
Edits on 27 Jul, 2022
"remove blacklisted domain URLs"
Golden AI
edited on 27 Jul, 2022
Infobox
Founded date
1977
0
Edits on 10 Jun, 2022
"Entity importer update"
Golden AI
edited on 10 Jun, 2022
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Is a
Organization
Edits on 3 Jun, 2022
Tim D
edited on 3 Jun, 2022
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+1
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Founded date
1977
0
Edits on 3 May, 2022
Tim D
edited on 3 May, 2022
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+1
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Crunchbase
https://www.crunchbase.com/organization/aehr-test-systems
Edits on 8 Apr, 2022
"Patent autocalculation"
Golden AI
edited on 8 Apr, 2022
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Patents assigned (count)
49
Edits on 14 Dec, 2021
"Remove inverse infobox"
Golden AI
edited on 14 Dec, 2021
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Patents
US Patent 11112429 Pressure relief valve
US Patent 7126363 Die carrier
US Patent 7301358 Contactor assembly for testing electrical circuits
US Patent 7303929 Reloading of die carriers without removal of die carriers from sockets on test boards
US Patent 7385407 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
US Patent 7511521 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
US Patent 7541822 Wafer burn-in and text employing detachable cartridge
US Patent 7619428 Wafer level burn-in and electrical test system and method
US Patent 7667475 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
US Patent 7762822 Apparatus for testing electronic devices
US Patent 7826995 Apparatus for testing electronic devices
US Patent D629760 Interface on an electronics connector
US Patent 7902846 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
US Patent 7928754 Wafer level burn-in and electrical test system and method
US Patent 7969175 Separate test electronics and blower modules in an apparatus for testing an integrated circuit
Edits on 8 Dec, 2021
Golden AI
edited on 8 Dec, 2021
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Patents
US Patent 7969175 Separate test electronics and blower modules in an apparatus for testing an integrated circuit
Golden AI
edited on 7 Dec, 2021
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+1
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Patents
US Patent 7928754 Wafer level burn-in and electrical test system and method
Edits on 7 Dec, 2021
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox
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+1
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Patents
US Patent 7902846 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
Golden AI
edited on 6 Dec, 2021
Edits made to:
Infobox
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+1
properties)
Infobox
Patents
US Patent D629760 Interface on an electronics connector
Edits on 6 Dec, 2021
Golden AI
edited on 6 Dec, 2021
Edits made to:
Infobox
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+1
properties)
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Patents
US Patent 7826995 Apparatus for testing electronic devices
Golden AI
edited on 5 Dec, 2021
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+1
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Patents
US Patent 7762822 Apparatus for testing electronic devices
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