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US Patent 10915602 Automatic detection of outliers in multivariate data

Patent 10915602 was granted and assigned to Micro Focus Limited on February, 2021 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
1
Date Filed
March 18, 2015
1
Date of Patent
February 9, 2021
1
Patent Application Number
15553278
1
Patent Citations Received
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US Patent 12019975 Automatic webpage layout checker: 5D deep learning based on unique rules for coloring web component borders and non-space
2
‌
US Patent 11782685 Software code vectorization converter
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US Patent 12015531 Method for generating a quality of experience (QoE) index by way of ensemble of expectation scores
3
Patent Inventor Names
Lakshmi Nagarajan
1
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
10915602
1
Patent Primary Examiner
‌
Toan M Le
1
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