US Patent 7183540 Apparatus for measuring photo diodes' temperature dependence
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Patent Inventor Names
Chao Zhang0
Jun Cao0
Xuefei Zeng0
Yuanjun Huang0
Zhiyong Jiang0
Zhong Yang0
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Patent abstract
A system for measuring gains of a plurality of photo diodes includes a chamber adapted to host the plurality of photo diodes and a temperature control unit configured to control the temperature within the chamber to a predetermined temperature. A control unit selects at least one of the plurality of photo diodes. A hosting unit is configured to provide a bias voltage to the selected photo diode at the predetermined temperature. A light source transmits photo signals to the selected photo diode at the predetermined temperature. A measurement unit configured to measure current signals generated by the selected photo diode in response to the photo signals under the bias voltage at the predetermined temperature.
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US Patent 07183540 Apparatus for measuring photo diodes' temperature dependence US Patent 7183540 Apparatus for measuring photo diodes' temperature dependence
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Patent Number
071835400
Patent Number
71835400
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Patent Jurisdiction
Patent Number
071835400
Date of Patent
February 27, 2007
0Patent Application Number
110823570
Date Filed
March 17, 2005
0Official Website
Patent Primary Examiner
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US Patent 07183540 Apparatus for measuring photo diodes' temperature dependence
Infobox
Is a
Patent jurisdiction
Patent number
07183540
Date of patent
February 27, 2007
Patent application number
11082357
Date Filed
March 17, 2005
Patent primary examiner
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