List of Advantest patents

Patents where

Current Assignee

Name

Advantest

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 9262376 Test apparatus and test method	Patent 9262376 was granted and assigned to Advantest on February, 2016 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	9262376	February 16, 2016
‌ US Patent 7466065 Bimorph switch, bimorph switch manufacturing method, electronic circuitry and electronic circuitry manufacturing method	Patent 7466065 was granted and assigned to Advantest on December, 2008 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	7466065	December 16, 2008
‌ US Patent 8170071 Laser apparatus	Patent 8170071 was granted and assigned to Advantest on May, 2012 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	8170071	May 1, 2012
‌ US Patent 9329215 Impedance measurement apparatus	Patent 9329215 was granted and assigned to Advantest on May, 2016 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	9329215	May 3, 2016
‌ US Patent 9584114 Semiconductor switch	Patent 9584114 was granted and assigned to Advantest on February, 2017 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	9584114	February 28, 2017
‌ US Patent 7755377 Driver circuit and test apparatus	Patent 7755377 was granted and assigned to Advantest on July, 2010 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	7755377	July 13, 2010
‌ US Patent 9318955 Power supply apparatus with feedback ratio calculation unit	Patent 9318955 was granted and assigned to Advantest on April, 2016 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	9318955	April 19, 2016
‌ US Patent 7679390 Test apparatus and pin electronics card	Patent 7679390 was granted and assigned to Advantest on March, 2010 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	7679390	March 16, 2010
‌ US Patent 7840858 Detection apparatus and test apparatus	Patent 7840858 was granted and assigned to Advantest on November, 2010 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	7840858	November 23, 2010
‌ US Patent 7757134 Test apparatus for testing a memory and electronic device housing a circuit	Patent 7757134 was granted and assigned to Advantest on July, 2010 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	7757134	July 13, 2010
‌ US Patent 7656234 Circuit and oscillating apparatus	Patent 7656234 was granted and assigned to Advantest on February, 2010 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	7656234	February 2, 2010
‌ US Patent 11132297 Addressing scheme for distributed hardware structures	Patent 11132297 was granted and assigned to Advantest on September, 2021 by the United States Patent and Trademark Office.	Advantest	Advantest	United States Patent and Trademark Office	11132297	September 28, 2021
‌ US Patent 7126367 Test apparatus, test method, electronic device, and electronic device manufacturing method	Patent 7126367 was granted and assigned to Advantest on October, 2006 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	7126367	October 24, 2006
‌ US Patent 11162990 Calibration arrangement and method for deriving a resistance of a resistor	Patent 11162990 was granted and assigned to Advantest on November, 2021 by the United States Patent and Trademark Office.	Advantest	Advantest	United States Patent and Trademark Office	11162990	November 2, 2021
‌ US Patent 11105855 Tester and method for testing a device under test and tester and method for determining a single decision function	Patent 11105855 was granted and assigned to Advantest on August, 2021 by the United States Patent and Trademark Office.	Advantest	Advantest	United States Patent and Trademark Office	11105855	August 31, 2021
‌ US Patent 7952359 Test apparatus having bidirectional differential interface	Patent 7952359 was granted and assigned to Advantest on May, 2011 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	7952359	May 31, 2011
‌ US Patent 7859444 D-A converter and D-A converting method	Patent 7859444 was granted and assigned to Advantest on December, 2010 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	7859444	December 28, 2010
‌ US Patent 9140752 Tester hardware	Patent 9140752 was granted and assigned to Advantest on September, 2015 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	9140752	September 22, 2015
‌ US Patent 7778785 Signal-to-noise ratio measurement for discrete waveform	Patent 7778785 was granted and assigned to Advantest on August, 2010 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	7778785	August 17, 2010
‌ US Patent 7756664 Test apparatus and measurement circuit	Patent 7756664 was granted and assigned to Advantest on July, 2010 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	7756664	July 13, 2010
‌ US Patent 9188633 Power supply apparatus for test apparatus	Patent 9188633 was granted and assigned to Advantest on November, 2015 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	9188633	November 17, 2015
‌ US Patent 7876120 Test apparatus, pin electronics card, electrical device and switch	Patent 7876120 was granted and assigned to Advantest on January, 2011 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	7876120	January 25, 2011
‌ US Patent 7756654 Test apparatus	Patent 7756654 was granted and assigned to Advantest on July, 2010 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	7756654	July 13, 2010
‌ US Patent 7772931 Oscillator and a tuning method of a loop bandwidth of a phase-locked-loop	Patent 7772931 was granted and assigned to Advantest on August, 2010 by the United States Patent and Trademark Office.		Advantest	United States Patent and Trademark Office	7772931	August 10, 2010
‌ US Patent 11108640 Controlling devices in a decentralized storage environment	Patent 11108640 was granted and assigned to Advantest on August, 2021 by the United States Patent and Trademark Office.	Advantest	Advantest	United States Patent and Trademark Office	11108640	August 31, 2021

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