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Colin W Kreutzer

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Edits on 14 Dec, 2021

"Remove inverse infobox"

edited on 14 Dec, 2021

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Infobox (-4 properties)

Infobox

Patent primary examiner of

US Patent 11175239 Foreign substance inspection apparatus, processing apparatus, and article manufacturing method

US Patent 11181832 Movable body apparatus, exposure apparatus, and device manufacturing method

US Patent 11181835 Metrology sensor, lithographic apparatus and method for manufacturing devices

US Patent 11187976 Methods of detecting printing defects on photoresist patterns

Edits on 2 Dec, 2021

edited on 2 Dec, 2021

Edits made to:

Infobox (+1 properties)

Infobox

Patent primary examiner of

US Patent 11187976 Methods of detecting printing defects on photoresist patterns

Edits on 25 Nov, 2021

edited on 25 Nov, 2021

Edits made to:

Infobox (+1 properties)

Infobox

Patent primary examiner of

US Patent 11181835 Metrology sensor, lithographic apparatus and method for manufacturing devices

edited on 25 Nov, 2021

Edits made to:

Infobox (+1 properties)

Infobox

Patent primary examiner of

US Patent 11181832 Movable body apparatus, exposure apparatus, and device manufacturing method

Edits on 19 Nov, 2021

edited on 19 Nov, 2021

Edits made to:

Infobox (+1 properties)

Infobox

Patent primary examiner of

US Patent 11175239 Foreign substance inspection apparatus, processing apparatus, and article manufacturing method

"Created via: Entity Importer"

created this topic on 19 Nov, 2021

Edits made to:

Infobox (+2 properties)

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Colin W Kreutzer

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Current Employer

United States Patent and Trademark Office

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