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Donghee Kang

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Edits on 14 Dec, 2021

"Remove inverse infobox"

edited on 14 Dec, 2021

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Infobox (-5 properties)

Infobox

Patent primary examiner of

US Patent 7095066 Process for making a CMOS image sensor

US Patent 7115453 Semiconductor device and manufacturing method of the same

US Patent RE39393 Device for reading an image having a common semiconductor layer

US Patent 7140374 System, method and apparatus for self-cleaning dry etch

US Patent 7163893 Advanced barrier liner formation for vias

Edits on 21 Nov, 2021

edited on 21 Nov, 2021

Edits made to:

Infobox (+1 properties)

Infobox

Patent primary examiner of

US Patent 7163893 Advanced barrier liner formation for vias

Edits on 19 Nov, 2021

edited on 19 Nov, 2021

Edits made to:

Infobox (+1 properties)

Infobox

Patent primary examiner of

US Patent 7140374 System, method and apparatus for self-cleaning dry etch

edited on 19 Nov, 2021

Edits made to:

Infobox (+1 properties)

Infobox

Patent primary examiner of

US Patent RE39393 Device for reading an image having a common semiconductor layer

Edits on 17 Nov, 2021

edited on 17 Nov, 2021

Edits made to:

Infobox (+1 properties)

Infobox

Patent primary examiner of

US Patent 7115453 Semiconductor device and manufacturing method of the same

Edits on 17 Nov, 2021

edited on 17 Nov, 2021

Edits made to:

Infobox (+1 properties)

Infobox

Patent primary examiner of

US Patent 7095066 Process for making a CMOS image sensor

"Created via: Entity Importer"

created this topic on 17 Nov, 2021

Edits made to:

Infobox (+2 properties)

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Donghee Kang

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United States Patent and Trademark Office

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