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Erik Kielin
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Edits on 15 Dec, 2021
"Remove inverse infobox"
Golden AI
edited on 15 Dec, 2021
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-4
properties)
Infobox
Patent primary examiner of
US Patent 11171137 Method of making FinFET CMOS device including single diffusion break in each of NMOS and PMOS regions
US Patent 11177165 Method of manufacturing a semiconductor device having redistribution layer including a dielectric layer made from a low-temperature cure polyimide
US Patent 11177309 Image sensor with pad structure
US Patent 7153756 Bonded SOI with buried interconnect to handle or device wafer
Edits on 19 Nov, 2021
Golden AI
edited on 19 Nov, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7153756 Bonded SOI with buried interconnect to handle or device wafer
Edits on 19 Nov, 2021
Golden AI
edited on 19 Nov, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 11177309 Image sensor with pad structure
Golden AI
edited on 19 Nov, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 11177165 Method of manufacturing a semiconductor device having redistribution layer including a dielectric layer made from a low-temperature cure polyimide
Edits on 11 Nov, 2021
Golden AI
edited on 11 Nov, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 11171137 Method of making FinFET CMOS device including single diffusion break in each of NMOS and PMOS regions
"Created via: Entity Importer"
Golden AI
created this topic on 11 Nov, 2021
Edits made to:
Infobox
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+2
properties)
Erik Kielin
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United States Patent and Trademark Office
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