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G01N 23/223
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups [CPC: G01N3/00] – [CPC: G01N17/00], [CPC: G01N21/00] or [CPC: G01N22/00] by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
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