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Nicole M Ippolito

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Edits on 14 Dec, 2021
"Remove inverse infobox"
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edited on 14 Dec, 2021
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Patent primary examiner of
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US Patent 11170985 Surface-assisted laser desorption/ionization method, mass spectrometry method and mass spectrometry device
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US Patent 11175307 Conductive atomic force microscopy system with enhanced sensitivity and methods of using such a system
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US Patent 11175590 Low dose charged particle metrology system
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US Patent 11177107 Multi charged particle beam writing apparatus
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US Patent 11177111 Defect observation device
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US Patent 11179118 Radiation shield assembly
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US Patent 11179518 Syringe shield assembly for housing and transporting a syringe containing radioactive drug
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US Patent 11189456 Sample inspection method and system
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US Patent 11189474 Sample support, ionization method, and mass spectrometry method
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US Patent 11189476 Sample support, ionization method, and mass spectrometry method
Edits on 2 Dec, 2021
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edited on 2 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 11189476 Sample support, ionization method, and mass spectrometry method
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Golden AI
edited on 2 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 11189474 Sample support, ionization method, and mass spectrometry method
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Golden AI
edited on 2 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 11189456 Sample inspection method and system
Edits on 25 Nov, 2021
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edited on 25 Nov, 2021
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Golden AI
edited on 25 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 11179118 Radiation shield assembly
Edits on 19 Nov, 2021
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Golden AI
edited on 19 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 11177111 Defect observation device
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Golden AI
edited on 19 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 11177107 Multi charged particle beam writing apparatus
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Golden AI
edited on 19 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 11175590 Low dose charged particle metrology system
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Golden AI
edited on 19 Nov, 2021
Edits on 11 Nov, 2021
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edited on 11 Nov, 2021
"Created via: Entity Importer"
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created this topic on 11 Nov, 2021
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 Nicole M Ippolito

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Is a
Person
Person
Current Employer
United States Patent and Trademark Office
United States Patent and Trademark Office

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