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Roberto Velez

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Edits on 14 Dec, 2021
"Remove inverse infobox"
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Golden AI
edited on 14 Dec, 2021
Edits made to:
Infobox (-40 properties)
Infobox
Patent primary examiner of
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US Patent 7750654 Probe method, prober, and electrode reducing/plasma-etching processing mechanism
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US Patent 7768290 Circuit and apparatus for detecting electric current
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US Patent 7821285 Liquid crystal display apparatus and testing method for liquid crystal display apparatus
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US Patent 7830165 System and method for detecting single event latchup in integrated circuits
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US Patent 7863916 Device mounted apparatus, test head, and electronic device test system
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US Patent 7923989 Test handler
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US Patent 7923990 Wafer holder
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US Patent 7923991 Signal testing apparatus
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US Patent 7924033 Compensation tool for calibrating an electronic component testing machine to a standardized value
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US Patent 7924034 Electric connecting apparatus
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US Patent 7924040 Electrical probe having a conductive whisker
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US Patent 7924044 On-chip test circuit for an embedded comparator
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US Patent 7924045 Apparatus, system, and method for error detection in a stand alone power supply
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US Patent 7928720 Power conversion efficiency measurement system and method
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US Patent 7928752 Display device, display device testing system and method for testing a display device using the same
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US Patent 7928755 Methods and apparatus that selectively use or bypass a remote pin electronics block to test at least one device under test
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US Patent 7932714 Method to communicate with multivalved sensor on loop power
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US Patent 7932737 Prober for testing devices in a repeat structure on a substrate
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US Patent 7936164 Folding current sensor
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US Patent 7944197 Clamp meter with rotary mechanism for clamp jaws
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US Patent 7944198 Multimeter
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US Patent 7944200 Probe apparatus
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US Patent 7948255 Test handler
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US Patent 7952345 Inverted magnetic isolator
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US Patent 7952374 Transient emission scanning microscopy
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US Patent 7956620 System and method for augmented impedance sensing
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US Patent 7960980 Testing device to test plates for electronic circuits and relative method
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US Patent 7960988 Contactor for electrical test, electrical connecting apparatus using the same, and method for manufacturing contactor
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US Patent 7960994 Test circuit for use in a semiconductor apparatus
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US Patent 7969140 Magnetic field sensor and electrical current sensor therewith
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US Patent 7973533 In-circuit testing for integrity of solid-state switches
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US Patent 7973550 Semiconductor device test apparatus including interface unit and method of testing semiconductor device using the same
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US Patent 7982483 Circuit and method for component communication
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US Patent 7982485 Semiconductor test device capable of modifying an amplitude of an output signal of a driver
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US Patent 7982487 System for multiple layer printed circuit board misregistration testing
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US Patent 7990132 Current sensor including an integrated circuit die including a first and second coil
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US Patent 7990166 Testing module for testing key buttons of portable electronic device
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US Patent 7990168 Probe card including a sub-plate with a main supporter and a sub-supporter with the sub-supporter having probe needles
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US Patent 8004299 Cantilever probe structure for a probe card assembly
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US Patent 8004300 Circuit board testing device with self aligning plates
Edits on 8 Dec, 2021
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Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8004300 Circuit board testing device with self aligning plates
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Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8004299 Cantilever probe structure for a probe card assembly
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Golden AI
edited on 8 Dec, 2021
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7990166 Testing module for testing key buttons of portable electronic device
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7990132 Current sensor including an integrated circuit die including a first and second coil
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Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7982483 Circuit and method for component communication
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Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7982487 System for multiple layer printed circuit board misregistration testing
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Golden AI
edited on 8 Dec, 2021
Edits on 8 Dec, 2021
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Golden AI
edited on 8 Dec, 2021
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7973533 In-circuit testing for integrity of solid-state switches
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7969140 Magnetic field sensor and electrical current sensor therewith
Golden AI profile picture
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7960994 Test circuit for use in a semiconductor apparatus
Golden AI profile picture
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7960980 Testing device to test plates for electronic circuits and relative method
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Golden AI
edited on 7 Dec, 2021
Golden AI profile picture
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7956620 System and method for augmented impedance sensing
Golden AI profile picture
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7952374 Transient emission scanning microscopy
Golden AI profile picture
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7952345 Inverted magnetic isolator
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Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7948255 Test handler
Golden AI profile picture
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7944200 Probe apparatus

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