TeraView

US Patent 11085755 Method and system for measuring coating thickness

US Patent 11169202 Test system

US Patent 7364993 Method of enhancing the photoconductive properties of a semiconductor

US Patent 7397428 Coherent THz emitter with DC power reducing resistor

US Patent 7485863 Method and apparatus for investigating a sample

US Patent 7609208 Electrodes on a photoconductive substrate for generation and detection of terahertz radiation

US Patent 7612341 Image of sample using terahertz time domain spectroscopy in reflection mode to identify in a first material like normal breast tissue a second material like cancerous tissue by evaluating the phase change at the interface between the sample and a window like a quartz window, against which the sample is pressed

US Patent 7663107 Method and apparatus for quantitative analysis using terahertz radiation

US Patent 7675036 Reducing scattering related features in terhertz time domain spectroscopy by averaging the impulse waveform over a plurality of sample points

US Patent 7693571 Method and apparatus for terahertz imaging

US Patent 7728296 Spectroscopy apparatus and associated technique

US Patent 7742172 Apparatus for varying the path length of a beam of radiation

US Patent 7777187 Apparatus and method for investigating a sample

US Patent 7804069 Imaging apparatus and method