US Patent 10000298 Metrology system for positioning assemblies
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Patent abstract
A method and apparatus for maintaining a selected configuration for a structure during a manufacturing process for forming a product using the structure. Metrology data for a support system is received. The support system holds the structure during the manufacturing process. A determination is made as to whether a current configuration of the structure is within selected tolerances of the selected configuration for the structure based on the metrology data. The support system is reconfigured to move the structure into the selected configuration in response to a determination that the current configuration of the structure is not within the selected tolerances of the selected configuration for the structure.
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Patent Inventor Names
Clayton Lynn Munk0
Dan Dresskell Day0
Eric M. Reid0
James M. Cobb0
Matthew Ray DesJardien0
Steven A. Best0
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US Patent 10000298 Metrology system for positioning assemblies
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Is a
Patent jurisdiction
Patent number
10000298
Date of patent
June 19, 2018
Patent application number
14559034
Date Filed
December 3, 2014
Patent primary examiner
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