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US Patent 10008005 Measurement system and method for measuring multi-dimensions
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Patent
Date Filed
November 16, 2016
Date of Patent
June 26, 2018
Patent Application Number
15353704
Patent Citations Received
US Patent 11669988 System and method for three-dimensional box segmentation and measurement
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US Patent 12112468 Method and apparatus for detecting dimension error
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Patent Inventor Names
Kun-Lung Tseng
0
Zih-Jian Jhang
0
Yueh-Yi Lai
0
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
10008005
Patent Primary Examiner
Nguyen Truong
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