Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
July 17, 2018
Patent Application Number
15614766
Date Filed
June 6, 2017
Patent Citations Received
Patent Primary Examiner
Patent abstract
Various embodiments for a multi-focal selective illumination microscopy (SIM) system for generating multi-focal patterns of a sample are disclosed. The multi-focal SIM system performs a focusing, scaling and summing operation on each generated multi-focal pattern in a sequence of multi-focal patterns that completely scan the sample to produce a high resolution composite image.
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