Patent attributes
A disclosed electrical cell enables experimental measurements of dielectric properties of an electrochromic material in the radio-frequency range of the electromagnetic spectrum. In an example embodiment, the electrical cell includes a layer of the electrochromic material under test that is sandwiched between a conducting base plane and a microstrip line. The conducting base plane and the microstrip line are electrically connected to a co-planar waveguide configured for application of superimposed DC-bias and RF-probe signals using a conventional probe station and a vector network analyzer. The S-parameters of the electrical cell measured in this manner can then be used, e.g., to obtain the complex dielectric constant of the electrochromic material under test as a function of frequency.
