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US Patent 10043264 Integration of automatic and manual defect classification
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Date Filed
April 19, 2012
Date of Patent
August 7, 2018
Patent Application Number
13451496
Patent Citations Received
US Patent 11501951 X-ray imaging in cross-section using un-cut lamella with background material
US Patent 11404244 High-resolution x-ray spectroscopy surface material analysis
US Patent 11430105 Workpiece inspection and defect detection system including monitoring of workpiece images
US Patent 12026865 Image analysis system for testing in manufacturing
0
US Patent 10482590 Method and system for defect classification
US Patent 10762618 Mask weak pattern recognition apparatus and mask weak pattern recognition method
US Patent 11756186 Workpiece inspection and defect detection system utilizing color channels
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
10043264
Patent Primary Examiner
Carol Wang
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