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US Patent 10055533 Visualization of analysis process parameters for layout-based checks

Patent 10055533 was granted and assigned to Mentor Graphics on August, 2018 by the United States Patent and Trademark Office.

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Patent abstract

Techniques and mechanisms for marking the parameters of a circuit analysis process for visual identification are disclosed. The visually-identified parameters can then be employed with the results of the circuit analysis to debug the layout design.

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