US Patent 10067065 Electronic device inspecting system and method

A cover glass of an electronic device may be inspected for defects and damage such as cracks, fractures, scratches, and chips. The electronic device may be placed in an enclosure with a lighting assembly that emits light to the electronic device, and scattered light from defects and damage of the cover glass is captured by an imaging device. A shutter assembly facilitates the capture of scattered light and reduces the capture of reflected light, which enhances the exposure of defects and damage of the captured image of the cover glass. A mirror facilitates the capture of a side surface of the electronic device.