US Patent 10082475 X-ray fluorescence spectrometer
Patent 10082475 was granted and assigned to Rigaku on September, 2018 by the United States Patent and Trademark Office.
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Patent abstract
A scanning-type X-ray fluorescence spectrometer according to the present invention includes a quantitative analysis condition setting unit configured to determine whether or not to add, as an analytical element, a new detected element other than preset sample constituting elements, from an absorption-enhancement effect degree of fluorescent X-rays on an analytical value of an analytical element and an overlapping effect degree by an interfering line on an analytical line of the analytical element, on the basis of qualitative analysis results and semi-quantitative analysis results of standard samples.
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Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
100824750
Date of Patent
September 25, 2018
0Patent Application Number
155448960
Date Filed
August 26, 2016
0Patent Citations Received
Patent Primary Examiner
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Is a
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
100824750
Date of Patent
September 25, 2018
0Patent Application Number
155448960
Date Filed
August 26, 2016
0Patent Citations Received
Patent Primary Examiner
Edits on 23 Sep, 2022
Golden AI
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US Patent 10082475 X-ray fluorescence spectrometer
Infobox
Is a
Patent applicant
Current assignee
Patent jurisdiction
Patent number
10082475
Date of patent
September 25, 2018
Patent application number
15544896
Date Filed
August 26, 2016
Patent primary examiner
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