Patent attributes
The disclosure is directed to an integrated circuit structure and methods of forming the same. The integrated circuit structure may include: a set of fins within an ILD layer on a substrate; a first gate dielectric over the substrate and extending along opposing sidewalls of each fin in the set of fins, a metal stack adjacent to the first gate dielectric and on the opposing sidewalls of each fin, the metal stack having a first portion over the substrate and a second portion contacting the first gate dielectric and extending along the opposing sidewalls of each fin, wherein at least the first portion of the metal stack and a portion of the first gate dielectric above the substrate is replaced by another dielectric material; a set of epitaxial regions within the ILD layer; and a conductor within the ILD layer and extending over each epitaxial region.