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US Patent 10145671 Three dimensional laser measuring system and method

Patent 10145671 was granted and assigned to Topcon Positioning Systems on December, 2018 by the United States Patent and Trademark Office.

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Patent abstract

A laser measuring system is provided by combining N-beams, angle based modulation and a laser receiver and laser transmitter configured with corner reflectors for signal shift measuring to facilitate full three dimensional positioning.

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Patent Inventor Names
Nikolay V. Khatuntsev0
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Patent Citations Received
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US Patent 11644548 Laser measuring system
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Patent Citations Received
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US Patent 11592293 Laser measuring system with multiple synchronous bases
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Patent Citations Received
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US Patent 11549800 Self-leveling system for rotating laser systems
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Infobox
Is a
Patent
Patent
0
Patent Applicant
Topcon Positioning Systems
Topcon Positioning Systems
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Current Assignee
Topcon Positioning Systems
Topcon Positioning Systems
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
101456710
Date of Patent
December 4, 2018
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Patent Application Number
150863770
Date Filed
March 31, 2016
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Patent Citations Received
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US Patent 11333760 Frequency modulation for interference free optical time of flight system
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Patent Primary Examiner
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Samantha K Abraham
0
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Patent citations received
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US Patent 11333760 Frequency modulation for interference free optical time of flight system
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 US Patent 10145671 Three dimensional laser measuring system and method

Infobox
Is a
Patent
Patent
Patent applicant
Topcon Positioning Systems
Topcon Positioning Systems
Current assignee
Topcon Positioning Systems
Topcon Positioning Systems
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
10145671
Date of patent
December 4, 2018
Patent application number
15086377
Date Filed
March 31, 2016
Patent primary examiner
‌
Samantha K Abraham

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