Patent attributes
The invention concerns a method to detect and evaluate movement patterns and pen positions of an electronic pen with inertial measurement sensors during writing on a two-dimensional writing substrate, comprising: •an initial specification of two axes X, Y, that are orthogonal to each other on the writing substrate, and an axis Z that is perpendicular to the two-dimensional writing substrate, •whereby the X-axis defines the predominant writing direction, as well as a compensation of undesired drift in the pen position signal of the electronic pen to be output, comprising: •a moving average process during a predefined time interval and a predetermined frequency of the pen movements on the writing substrate, determined by the inertial measurement sensors during writing through integration of the sensor data of the measurement sensors, along the two said axes X, Y, that are orthogonal to each other, and a •periodic comparison of currently determined moving average values with initial average values and/or with previously determined moving average values, as well as the •subtraction of deviations, arising during said comparison between currently determined moving average values and initial average values and/or deviations between currently determined moving average values and previously determined moving average values from a pen position signal to be output.
