US Patent 10146375 Feature characterization from infrared radiation

Systems, apparatuses, and/or methods to characterize a user feature. For example, and apparatus may include a pattern receiver to receive a feature infrared (IR) pattern corresponding to non-uniform IR radiation reflected by skin of the user feature and an object IR pattern corresponding to IR radiation reflected by an object. The apparatus may further include a filter to generate a modified IR pattern from the object IR pattern and to remove at least a part of the modified IR pattern from feature IR pattern. In addition, the apparatus may include a feature characterizer to characterize the user feature based on the feature IR pattern. In one example, a computing platform may be controlled based on the characterization of the user feature.