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US Patent 10157093 Data integrity check within a data processing system

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Patent
Patent

Patent attributes

Patent Applicant
Freescale Semiconductor
Freescale Semiconductor
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10157093
Date of Patent
December 18, 2018
Patent Application Number
14722632
Date Filed
May 27, 2015
Patent Citations Received
‌
US Patent 11620184 Runtime integrity checking for a memory system
0
Patent Primary Examiner
‌
April Y Blair
Patent abstract

A memory system includes a memory array, control circuitry, and comparator circuitry. The memory array includes a first section having a first plurality of programmed bitcells having a first threshold voltage distribution and a second section having a second plurality of programmed bitcells having a second threshold voltage distribution which has a lower average threshold voltage than the first threshold voltage distribution. The first plurality and second plurality of programmed bitcells are programmed with a same set of data values. The control circuitry is configured to provide a read request to the memory array and receive read data in response to the read request, wherein the read data comprises first read data from the first section and second read data from the second section. The comparator circuitry is configured to compare the first read data to the second read data and generate an error indicator in response to the compare.

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