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US Patent 10163668 Thermal dynamic response sensing systems for heaters

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
October 31, 2014
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Date of Patent
December 25, 2018
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Patent Applicant
Watlow
Watlow
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Patent Application Number
14530670
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Patent Citations Received
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US Patent 11940487 Thermal solution for massively parallel testing
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US Patent 11774492 Test system including active thermal interposer device
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US Patent 11841392 Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
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US Patent 11852678 Multi-input multi-zone thermal control for device testing
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US Patent 11493551 Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
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US Patent 11549981 Thermal solution for massively parallel testing
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US Patent 11567119 Testing system including active thermal interposer device
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US Patent 11573262 Multi-input multi-zone thermal control for device testing
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US Patent 11587640 Carrier based high volume system level testing of devices with pop structures
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US Patent 11609266 Active thermal interposer device
•••
Patent Inventor Names
Louis P. Steinhauser
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
10163668
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Patent Primary Examiner
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Anne M Antonucci
0

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