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US Patent 10180397 Laser system for imaging and materials analysis
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Patent
Date Filed
August 22, 2014
Date of Patent
January 15, 2019
Patent Application Number
14913507
Patent Citations Received
US Patent 11874110 Self-mixing interferometry device configured for non-reciprocal sensing
0
US Patent 11680788 Handling obstructions and transmission element contamination for self-mixing particulate matter sensors
0
US Patent 11692809 Self-mixing interferometry-based absolute distance measurement with distance reference
0
US Patent 11774342 Particulate matter sensors based on split beam self-mixing interferometry sensors
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
10180397
Patent Primary Examiner
David P Porta
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