US Patent 10190977 Method of measurement of multilayer structures
Patent 10190977 was granted and assigned to Lumetrics, Inc. on January, 2019 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
May 3, 2017
Date of Patent
January 29, 2019
Patent Applicant
Patent Application Number
15585495
Patent Citations Received
Patent Inventor Names
Kyle J. Hadcock
0
Donald S. Gibson
0
Filipp V. Ignatovich
0
Michael A. Marcus
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
Find more entities like US Patent 10190977 Method of measurement of multilayer structures
Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
