US Patent 10191799 BER model evaluation

A memory system is configured to perform a test operation to determine a deviation of a target storage location's bit error rate response relative to a model. The memory system determines the deviation level by measuring data sets stored in the target storage location to determine an actual bit error rate value and another actual parameter value used to estimate bit error rate. The memory system obtains an estimated value from the model based on the actual values and identifies the deviation by comparing the estimated value with the actual values.