US Patent 10197517 Probe heater remaining useful life determination

A probe system is configured to receive thermal images of the probe system from a thermal imager and includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational voltage is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to provide the operational voltage and receive the thermal images from the thermal imager. The control circuit is further configured to monitor the thermal images over time and determine a remaining useful life of the probe system based upon the thermal images over time.