US Patent 10222294 Wafer level testing of optical devices
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Patent abstract
A wafer includes multiple optical devices. One of the devices includes a waveguide that terminates at a facet that is included in a testing port. Light is injected from a light source into the waveguide through the facet without being reflected between exiting from the light source and entering the facet. The devices are separated from the wafer after the light is injected into the waveguide.
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Patent Citations Received
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Patent Inventor Names
Dazeng Feng0
Hong Liang0
Edits on 25 Sep, 2022
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Infobox
Is a
Patent Applicant
Patent Jurisdiction
Patent Number
102222940
Date of Patent
March 5, 2019
0Patent Application Number
146752560
Date Filed
March 31, 2015
0Patent Primary Examiner
Edits on 25 Jan, 2022
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US Patent 10222294 Wafer level testing of optical devices
Infobox
Is a
Patent applicant
Patent jurisdiction
Patent number
10222294
Date of patent
March 5, 2019
Patent application number
14675256
Date Filed
March 31, 2015
Patent primary examiner
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