US Patent 10224174 Transmission charged particle microscope with imaging beam rotation
Patent 10224174 was granted and assigned to FEI Company on March, 2019 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
November 3, 2017
Date of Patent
March 5, 2019
Patent Applicant
Patent Application Number
15803642
Patent Inventor Names
Peter Christiaan Tiemeijer
0
Bert Henning Freitag
0
Maarten Bischoff
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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