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US Patent 10291263 Auto-learning log likelihood ratio

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
Date Filed
July 24, 2017
Date of Patent
May 14, 2019
Patent Application Number
15658151
Patent Citations Received
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US Patent 11514992 Method and apparatus for reading a flash memory device
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US Patent 11514994 Method and apparatus for outlier management
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US Patent 11398291 Method and apparatus for determining when actual wear of a flash memory device differs from reliability states for the flash memory device
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US Patent 11843393 Method and apparatus for decoding with trapped-block management
0
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US Patent 11934696 Machine learning assisted quality of service (QoS) for solid state drives
0
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US Patent 11531587 Dynamic multi-stage decoding
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US Patent 11606105 Dynamic multi-stage decoding
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US Patent 11663076 Memory address protection
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US Patent 11699493 Method and apparatus for performing a read of a flash memory using predicted retention-and-read-disturb-compensated threshold voltage shift offset values
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10291263
Patent Primary Examiner
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Fritz Alphonse

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