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US Patent 10324204 Diffraction imaging systems and methods using specularity gathers

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Patent

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10324204
Date of Patent
June 18, 2019
Patent Application Number
14337120
Date Filed
July 21, 2014
Patent Citations Received
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US Patent 11402529 Identifying geologic features in a subterranean formation using seismic diffraction and refraction imaging
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US Patent 11313988 Identifying geologic features in a subterranean formation using seismic diffraction imaging
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US Patent 11320557 Post-stack time domain image with broadened spectrum
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US Patent 11467303 Identifying geologic features in a subterranean formation using a post-stack seismic diffraction imaging condition
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US Patent 11016212 Compressing seismic wavefields in three-dimensional reverse time migration
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US Patent 11029431 Generating common image gather using wave-field separation
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US Patent 11041970 Generating common image gather using wave-field separation
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US Patent 11275190 Generating diffraction images based on wave equations
...
Patent Primary Examiner
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Sujoy K Kundu
Patent abstract

In some embodiments, a seismic processing method comprises assembling a specularity gather by determining a specularity value at each of a plurality of subsurface locations, and summing trace amplitudes into a plurality of bins, each bin characterized by a range of specularity values. The specularity value at a subsurface location is computed according to an angle between a normal to a local reflector and a direction of a total (source+receiver) traveltime gradient. For example, the specularity may be proportional to (e.g. equal to) a magnitude of the cosine of the angle. A diffraction image may be generated by summing specularity gather data over specularity, with specular event amplitudes attenuated relative to diffractive event amplitudes.

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