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US Patent 10346757 Systems and methods for parallelizing Bayesian optimization

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
0
Date Filed
May 30, 2014
0
Date of Patent
July 9, 2019
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Patent Application Number
14291337
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Patent Citations Received
‌
US Patent 11775878 Automated machine learning test system
‌
US Patent 11475239 Solution to end-to-end feature engineering automation
Patent Inventor Names
Hugo Larochelle
0
Roland Jasper Snoek
0
Ryan P. Adams
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
10346757
0
Patent Primary Examiner
‌
Kamran Afshar
0

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