Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Kenichi Anzou0
Date of Patent
July 23, 2019
0Patent Application Number
159895930
Date Filed
May 25, 2018
0Patent Citations Received
Patent Primary Examiner
Patent abstract
According to one embodiment, a semiconductor integrated circuit comprises: a tested block including a test control circuit; and a control circuit configured to output a first signal. The test control circuit performs a test of at least a first test pattern of the test patterns for the scan chain in accordance with the first signal during a first non-access state period of the tested block, and performs a test of at least a second test pattern following the first test pattern of the test patterns for the scan chain in accordance with the first signal during a second non-access state period of the tested block, and the test of the first test pattern and the test of the second test pattern are performed discontinuously.
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