Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
July 30, 2019
Patent Application Number
15454814
Date Filed
March 9, 2017
Patent Citations Received
Patent Primary Examiner
Patent abstract
A particle characterization apparatus comprising: a light source for illuminating a sample with a light beam; a detector arranged to detect scattered light from the interaction of the light beam with the sample; and a focus tuneable lens arranged to collect the scattered light for the detector from a scattering volume and/or to direct the light beam into the sample.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.
