US Patent 10365233 X-ray apparatus
Patent 10365233 was granted and assigned to Nikon Metrology on July, 2019 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
August 12, 2015
0
Date of Patent
July 30, 2019
0
Patent Applicant
Patent Application Number
15503318
0
Patent Citations Received
Patent Inventor Names
Ben Price
0
James Smith
0
Michael Beechey
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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