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US Patent 10373873 Gate cut in replacement metal gate process
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Patent
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Date Filed
March 23, 2018
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Date of Patent
August 6, 2019
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Patent Application Number
15933708
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Patent Citations
US Patent 10090402 Methods of forming field effect transistors (FETS) with gate cut isolation regions between replacement metal gates
Patent Citations Received
US Patent 11508582 Cut metal gate processes
US Patent 11935958 Semiconductor device structure and method for forming the same
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US Patent 11990341 Cut metal gate processes
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US Patent 12027608 Semiconductor structure having dielectric structure extending into second cavity of semiconductor Fin
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Patent Inventor Names
Ruilong Xie
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Kangguo Cheng
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Laertis Economikos
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Chanro Park
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
10373873
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Patent Primary Examiner
Jami Valentine Miller
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