Is a
Patent attributes
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Jayesh Ranchhodbhai Patel0
Joseph Bendahan0
Date of Patent
August 20, 2019
Patent Application Number
15298503
Date Filed
October 20, 2016
Patent Citations Received
Patent Primary Examiner
Patent abstract
The present specification provides an X-ray inspection system including an X-ray source and a corresponding detector for detecting transmitted X rays having a wide range of intensities. The detector includes at least one crystal for producing a light signal upon interaction with X-rays. Each crystal is connected to at least one photodiode and a photomultiplier. A processing unit connected with the crystal rejects all detected radiation having energies below a predefined threshold value.
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