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US Patent 10402676 Automated system and methodology for feature extraction

Patent 10402676 was granted and assigned to Pictometry International Corp. on September, 2019 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Current Assignee
‌
Pictometry International Corp.
Date Filed
February 9, 2017
Date of Patent
September 3, 2019
Patent Applicant
‌
Pictometry International Corp.
Patent Application Number
15428860
Patent Citations Received
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US Patent 12136127 System and method for property condition analysis
0
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US Patent 11978227 Systems and methods for forest surveying
0
‌
US Patent 11983813 Method and system for determining solar access of a structure
0
‌
US Patent 10521694 3D building extraction apparatus, method and system
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US Patent 10529029 Platform, systems, and methods for identifying property characteristics and property feature maintenance through aerial imagery analysis
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US Patent 10650285 Platform, systems, and methods for identifying property characteristics and property feature conditions through aerial imagery analysis
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US Patent 11551413 Method and system for determining solar access of a structure
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US Patent 11551040 Platform, systems, and methods for identifying characteristics and conditions of property features through imagery analysis
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US Patent 10783648 Apparatus and method for processing image
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US Patent 11568639 Systems and methods for analyzing remote sensing imagery
•••
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10402676
Patent Primary Examiner
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Ali Bayat

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