US Patent 10434764 YAW measurement by spectral analysis

Some embodiments relate to a method of measuring a magnitude of a yaw angle of print head(s) or of a supporting print-bar thereof relative to cross-print direction. In some embodiments, a 1D-representation (1D-rep) of an ink-calibration image is transformed into the frequency domain (e.g. by FFT) characterized by peak profile. The yaw angle magnitude may be computed from relative energies of a primary and secondary peak of the peak profile of the frequency domain.