US Patent 10460818 Retention-drift-history-based non-volatile memory read threshold optimization

Methods, systems and computer-readable storage media for selecting a retention drift predictor scheme, reading retention drift history associated with reference cells of a plurality of groups of pages of a non-volatile memory (NVM), and predicting values for an optimal read threshold voltage of at least some of the plurality of groups of pages. The predicting of values for an optimal read threshold voltage may be based at least on the selected retention drift predictor scheme and the read retention drift history.