Is a
Patent attributes
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
November 5, 2019
Patent Application Number
15638510
Date Filed
June 30, 2017
Patent Citations Received
Patent Primary Examiner
Patent abstract
A method for calculating cell edge leakage in a semiconductor device comprising performing a device leakage simulation to obtain leakage information for different cell edge conditions and providing attributes associated with cell edges in the semiconductor device. The method further comprises performing an analysis to identify cell abutment cases present in the semiconductor device and calculating the leakage of the semiconductor device based at least in part on probabilities associated with the cell abutment cases and the simulated leakage values obtained from the device leakage simulation.
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