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US Patent 10468230 Nondestructive sample imaging

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
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Date Filed
April 10, 2018
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Date of Patent
November 5, 2019
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Patent Application Number
15949166
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Patent Citations
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US Patent 10033840 System and devices facilitating dynamic network link acceleration
Patent Citations Received
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US Patent 11927550 Sample mounting system for an X-ray analysis apparatus
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US Patent 11676795 Charged particle beam device for inspection of a specimen with a plurality of charged particle beamlets
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US Patent 11340179 Nanofabricated structures for sub-beam resolution and spectral enhancement in tomographic imaging
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US Patent 11404244 High-resolution x-ray spectroscopy surface material analysis
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US Patent 11501951 X-ray imaging in cross-section using un-cut lamella with background material
Patent Inventor Names
Michael S. Richman
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Adam J. Marcinuk
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Amrita V. Masurkar
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Chris L. Willis
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Eugene M. Lavely
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Jonathan K. Tong
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Jonathan R. Takahashi
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Paul R. Moffitt
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
10468230
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Patent Primary Examiner
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David A. Vanore
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