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US Patent 10497741 Apparatus and methods for optical emission detection
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Edits on 19 Jun, 2024
"update inverses"
Golden AI
edited on 19 Jun, 2024
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Patent Citations Received
US Patent 12013503 Lateral crystal photodiode readouts and switched diode networks for processing nuclear events
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Edits on 9 Dec, 2023
"Add patent abstract"
Golden AI
edited on 9 Dec, 2023
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Patent abstract
Apparatus and methods for optical emission detection comprising scintillating proximal sensors.
Edits on 3 Oct, 2023
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Golden AI
edited on 3 Oct, 2023
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Patent Inventor Names
Hongdi Li
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Hossain Baghaei
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Rocio Alicia Ramirez-Jaramillo
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Wai-hoi Wong
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Yuxuan Zhang
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Edits on 20 Sep, 2023
"update inverses"
Golden AI
edited on 20 Sep, 2023
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Patent Citations Received
US Patent 11762108 Modular pet detector comprising a plurality of modular one-dimensional arrays of monolithic detector sub-modules
Edits on 26 Apr, 2023
"Entity importer update"
Golden AI
edited on 26 Apr, 2023
Infobox
Is a
Patent
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
10497741
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Date of Patent
December 3, 2019
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Patent Application Number
16068168
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Date Filed
January 4, 2017
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Patent Citations Received
US Patent RE49174 Photosensors arranged on a surface of a scintillator
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Patent Primary Examiner
David P Porta
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Edits on 5 Apr, 2023
"update citations for inverse infoboxes"
Golden AI
edited on 5 Apr, 2023
Infobox
Patent Citations Received
US Patent RE49174 Photosensors arranged on a surface of a scintillator
0
Edits on 18 Aug, 2022
"update inverses"
Golden AI
edited on 18 Aug, 2022
Edits made to:
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+1
properties)
Infobox
Patent Citations Received
US Patent RE49174 Photosensors arranged on a surface of a scintillator
Edits on 30 Jan, 2022
"Created via: Entity Importer"
Golden AI
created this topic on 30 Jan, 2022
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US Patent 10497741 Apparatus and methods for optical emission detection
Infobox
Is a
Patent
Patent jurisdiction
United States Patent and Trademark Office
Patent number
10497741
Date of patent
December 3, 2019
Patent application number
16068168
Date Filed
January 4, 2017
Patent primary examiner
David P Porta
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