US Patent 10502777 Electronic circuit testing method and device
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Patent abstract
A method of testing a first circuit, including: a) applying a first signal between two terminals of the first circuit, the first circuit being powered off; and b) verifying that radio frequency waves transmitted by the first circuit correspond to an expected transmission.
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Patent Jurisdiction
Patent Number
105027770
Date of Patent
December 10, 2019
0Patent Application Number
161848590
Date Filed
November 8, 2018
0Patent Citations Received
Patent Primary Examiner
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Infobox
Is a
Patent Jurisdiction
Patent Number
105027770
Date of Patent
December 10, 2019
0Patent Application Number
161848590
Date Filed
November 8, 2018
0Patent Citations Received
Patent Primary Examiner
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Patent Citations Received
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US Patent 10502777 Electronic circuit testing method and device
Infobox
Is a
Patent jurisdiction
Patent number
10502777
Date of patent
December 10, 2019
Patent application number
16184859
Date Filed
November 8, 2018
Patent primary examiner
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