Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Scott J. Huter0
Edward Allen DeHoog0
Jeff Alan Burke0
Kevin Martin Magrini0
Nathan Franklin Engel0
Date of Patent
December 17, 2019
0Patent Application Number
158876390
Date Filed
February 2, 2018
0Patent Citations Received
Patent Primary Examiner
Patent abstract
A reflectometry instrument includes a light source for emitting an illumination beam that illuminates the macula. A portion of the illumination beam is reflected from the macula and forms a detection beam. The detection beam is indicative of macular pigment in the macula. The instrument also includes a first mirror for reflecting the illumination beam toward the macula and for reflecting the detection beam from the macula. The instrument is configured so that the illumination beam and the detection beam remain separated between the macula and the first mirror.
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