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US Patent 10514614 Process variability aware adaptive inspection and metrology
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Patent
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Date Filed
January 20, 2016
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Date of Patent
December 24, 2019
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Patent Application Number
15546592
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Patent Citations Received
US Patent 12092965 Process variability aware adaptive inspection and metrology
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US Patent 11003093 Process variability aware adaptive inspection and metrology
US Patent 11635699 Determining pattern ranking based on measurement feedback from printed substrate
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Patent Inventor Names
Stefan Hunsche
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Vivek Kumar Jain
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Venugopal Vellanki
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
10514614
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Patent Primary Examiner
Phallaka Kik
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