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US Patent 10535495 Sample manipulation for nondestructive sample imaging

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
April 10, 2018
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Date of Patent
January 14, 2020
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Patent Application Number
15949168
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Patent Citations Received
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US Patent 11927550 Sample mounting system for an X-ray analysis apparatus
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US Patent 11340179 Nanofabricated structures for sub-beam resolution and spectral enhancement in tomographic imaging
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US Patent 11404244 High-resolution x-ray spectroscopy surface material analysis
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US Patent 11501951 X-ray imaging in cross-section using un-cut lamella with background material
Patent Inventor Names
Paul R. Moffitt
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Adam J. Marcinuk
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Chris L. Willis
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Eugene M. Lavely
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Jonathan R. Takahashi
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
10535495
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Patent Primary Examiner
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David A. Vanore
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