Patent attributes
In one embodiment, a method includes accessing a point cloud comprising several points, wherein each point corresponds to a location on a surface of an object located in three-dimensional space; determining whether each point in the point cloud is part of a linear structure, a planar structure, or a volumetric structure; identifying a plurality of point clusters, wherein each point cluster comprises one or more points that are located within a grid segment on a two-dimensional grid derived from the three-dimensional space; determining, for each point cluster, whether the point cluster represents a vertical-linear structure or a portion of a vertical-linear structure; identifying one or more point-cluster pairs, wherein each point-cluster pair includes two point clusters corresponding to one or more vertical-linear structures within a threshold distance in the three-dimensional space; and determining, for each point-cluster pair, whether a line-of-sight exists between each point-cluster in the point-cluster pair.
